首页> 外国专利> PHOTORESIST POLYMER HAVING DICYCLOHEXYL PENDANT GROUP AND PHOTORESIST COMPOSITION INCLUDING THE SAME

PHOTORESIST POLYMER HAVING DICYCLOHEXYL PENDANT GROUP AND PHOTORESIST COMPOSITION INCLUDING THE SAME

机译:具有二环己基侧链的光致抗蚀剂聚合物和包含相同结构的光致抗蚀剂组成

摘要

A suitable photoresist to the photolithography process for a light source of deep ultraviolet region, in particular by using a short wavelength light source such as 193nm, 157nm the production of highly integrated semiconductor devices polymers and photoresist compositions containing the same are disclosed. The photo-resist polymer is to be with the repeating unit represented by formula (1a) comprising at least one repeating unit selected from the group consisting of the formula 1b and 1c.; [Chemical Formula 1a]; Formula 1b]; Formula 1c]; In Formula 1a to 1c, X 1, X 2, X 3 and X 4 are each independently selected from CH 2, CHOH, is O or S, R 1 is H, CH 3 or CF 3, R 3 and R 5 is are each a CH 3 or c 2 H 5 independently, R * is H or CH 3, m is an integer from 0 to 2, n and o are each independently 0 or 1, a, c and e are in the polymer a, c and e molar ratio of the repeating unit of the polymer as a whole number of the repeating units contained are a: c: e = 1 ~ 20mol%: 0 ~ 60 mol%: is 0 ~ 30 mol%.
机译:对于深紫外线区域的光源,特别是通过使用诸如193nm,157nm的短波长光源,适合光刻工艺的光致抗蚀剂公开了高集成度半导体器件聚合物和包含其的光致抗蚀剂组合物的生产。所述光致抗蚀剂聚合物应具有由式(1a)表示的重复单元,该重复单元包括至少一个选自由式1b和1c组成的组的重复单元。 [化学式1a];式1b];式1c];在式1a至 1c中,X 1,X 2, X 3和X 4 各自独立地选自CH 2,< / Sub> CHOH,是O或S,R 1 是H,CH 3 或CF 3, R 3 和R 5 分别是CH 3 或c 2 H 5 R * 独立地是H或CH 3, m是0到2的整数,n和o各自独立地是0或1,a,c和e在聚合物的重复单元的聚合物a,c和e的摩尔比在所包含的全部重复单元的总数中为:c:e = 1〜20mol%:0〜60mol%:为0〜30mol%。

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