首页> 外国专利> METHOD FOR MANUFACTURING SIC CRYSTAL TO REDUCE MICROPIPE PROPAGATING FROM SUBSTRATE AND SiC CRYSTAL, SiC SINGLE CRYSTAL FILM, SiC SEMICONDUCTOR ELEMENT, SiC SINGLE CRYSTAL SUBSTRATE AND ELECTRONIC DEVICE, AND METHOD FOR MANUFACTURING SiC BULK CRYSTAL

METHOD FOR MANUFACTURING SIC CRYSTAL TO REDUCE MICROPIPE PROPAGATING FROM SUBSTRATE AND SiC CRYSTAL, SiC SINGLE CRYSTAL FILM, SiC SEMICONDUCTOR ELEMENT, SiC SINGLE CRYSTAL SUBSTRATE AND ELECTRONIC DEVICE, AND METHOD FOR MANUFACTURING SiC BULK CRYSTAL

机译:制造SiC晶体以减少基体和SiC晶体,SiC单晶膜,SiC半导体元件,SiC单晶体基体和电子器件中的微管传播的方法以及制造SiC球体的方法

摘要

PROBLEM TO BE SOLVED: To provide a SiC crystal in which hollow-core defects that have propagated from a substrate can be reduced even when a SiC single crystal substrate having hollow-core defects called as micropipes is used.;SOLUTION: A source gas having a C/Si atom number ratio adjusted to a range in which the crystal growth rate is determined by the carbon atom supply limitation is brought into contact with a SiC substrate; and a plurality of SiC crystal layers are epitaxially grown into layers to dissociate the hollow-core defects in the SiC single crystal substrate into dislocations given by small Burgers vectors in order to prevent the defects from propagating to the crystal surface. A first SiC crystal is formed as a buffer layer, and further a SiC crystal is layered thereon by using a source gas having a C/Si ratio adjusted to be higher than that when forming the buffer layer.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种SiC晶体,即使使用具有称为微管的具有空心缺陷的SiC单晶衬底,也可以减少从衬底传播的空心缺陷。使C / Si原子数比与SiC基板接触,该C / Si原子数比调整为由碳原子的供给限制所决定的晶体生长速度的范围。然后,将多个SiC晶体层外延生长成层,以将SiC单晶衬底中的空心缺陷解离成由小的Burgers矢量给定的位错,以防止缺陷传播到晶体表面。形成第一SiC晶体作为缓冲层,然后通过使用C / Si比调整为高于形成缓冲层时的C / Si比的原料气体在其上层叠SiC晶体.COPYRIGHT:(C)2008,日本特许厅

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