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Laser processing device and method uses multi-wavelength laser beam focused at different depths in wafer for simultaneous division and wafer dicing

机译:激光加工装置和方法使用聚焦在晶片中不同深度的多波长激光束进行同时分割和晶片切割

摘要

A laser processing device comprises a unit to modify a region in a wafer (10) by multi-photon absorption in bringing a laser beam (La,Lb) to a focus (Pa,Pb). A light source (Sla) radiates a multi-wavelength beam that is focused by a collecting lens (CV) simultaneously giving many focus points for the different wavelengths and many modified regions (Ga1-3,Gb1-3) spaced in the depth of the wafer along a given dividing line (K). Independent claims are also included for the following: (A) Six processing methods; and (B) Six further laser processing devices as above.
机译:激光处理装置包括通过将激光束(La,Lb)聚焦到焦点(Pa,Pb)上的多光子吸收来改变晶片(10)中的区域的单元。光源(Sla)辐射多波长光束,该多波长光束由聚光透镜(CV)聚焦,同时为不同波长提供许多焦点,并在其深度上隔开许多修改区域(Ga1-3,Gb1-3)。晶片沿着给定的分割线(K)。还包括以下方面的独立权利要求:(A)六种处理方法; (B)上述六个另外的激光处理设备。

著录项

  • 公开/公告号DE102006053898A1

    专利类型

  • 公开/公告日2007-05-31

    原文格式PDF

  • 申请/专利权人 DENSO CORP.;

    申请/专利号DE20061053898

  • 发明设计人 TAMURA MUNEO;FUJII TETSUO;

    申请日2006-11-15

  • 分类号H01L21/301;B23K26/40;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:09

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