首页> 外国专利> MANUFACTURING METHOD OF GROUP III NITRIDE SEMICONDUCTOR, MANUFACTURING METHOD OF GROUP III NITRIDE SEMICONDUCTOR LIGHT-EMITTING ELEMENT, GROUP III NITRIDE SEMICONDUCTOR LIGHT-EMITTING ELEMENT AND LAMP

MANUFACTURING METHOD OF GROUP III NITRIDE SEMICONDUCTOR, MANUFACTURING METHOD OF GROUP III NITRIDE SEMICONDUCTOR LIGHT-EMITTING ELEMENT, GROUP III NITRIDE SEMICONDUCTOR LIGHT-EMITTING ELEMENT AND LAMP

机译:III族氮化物半导体发光元件的制造方法,III族氮化物半导体发光元件的制造方法,III族氮化物半导体发光元件和灯的制造方法

摘要

PROBLEM TO BE SOLVED: To provide a manufacturing method of a group III nitride semiconductor by which conductivity can be controlled on the basis of the quantity of an added donor impurity and a group III nitride semiconductor can be efficiently formed by a sputtering method.;SOLUTION: The manufacturing method of the group III nitride semiconductor is provided with a sputtering step of forming a single crystalline group III nitride semiconductor layer doped with a donor impurity by a sputtering method in an atmosphere containing 20-80% a nitride atom-containing gas and an inert gas.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种III族氮化物半导体的制造方法,通过该制造方法,可以基于添加的施主杂质的量来控制导电性,并且可以通过溅射法有效地形成III族氮化物半导体。 :III族氮化物半导体的制造方法具有溅射步骤,该溅射步骤在包含20-80%的含氮化物原子的气体,惰性气体;版权所有:(C)2008,日本特许厅&INPIT

著录项

  • 公开/公告号JP2008135463A

    专利类型

  • 公开/公告日2008-06-12

    原文格式PDF

  • 申请/专利权人 SHOWA DENKO KK;

    申请/专利号JP20060318826

  • 发明设计人 YOKOYAMA TAISUKE;HANAWA KENZO;

    申请日2006-11-27

  • 分类号H01L33/00;H01L21/203;C23C16/34;C23C14/06;

  • 国家 JP

  • 入库时间 2022-08-21 20:25:47

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