首页> 外国专利> SURFACE SHAPE MEASURING APPARATUS AND METHOD FOR DETECTING ANOMALY OF STYLUS LOAD

SURFACE SHAPE MEASURING APPARATUS AND METHOD FOR DETECTING ANOMALY OF STYLUS LOAD

机译:表面形状测量装置和测针负载异常的方法

摘要

PROBLEM TO BE SOLVED: To prevent a stylus and a pickup from being broken due to excessive loads acting on the stylus by detecting anomalies of loads acting the stylus in a surface shape measuring apparatus having the stylus which comes into contact with surfaces of objects to be measured.;SOLUTION: The surface shape measuring apparatus 1 for measuring the surface shape of an object to be measured W by relatively moving the stylus 11 as keeping the stylus 11 in contact with a surface of the object to be measured W, detecting displacements of the stylus 11 caused by irregularities of the surface of the object to be measured W, and creating displacement signals, includes a stylus-load-anomaly detection part 62 for detecting anomalies in changes in the displacement signals as anomalies in loads actin on the stylus 11.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:通过在具有触针的表面形状测量装置中检测触针的负载异常,以防止触针和拾音器因施加在触针上的负载过大而损坏。解决方案:表面形状测量装置1用于通过使测针11相对移动,同时使测针11与被测物体W接触来测量被测物体W的表面形状,从而检测被测物体W的位移。由待测物体W的表面不规则引起的触针11,并产生位移信号,包括用于检测位移信号变化的异常的触针负载异常检测部分62,该异常是由于触针11上的负载肌动蛋白异常而引起的。 。;版权所有:(C)2008,日本特许厅和INPIT

著录项

  • 公开/公告号JP2008032540A

    专利类型

  • 公开/公告日2008-02-14

    原文格式PDF

  • 申请/专利权人 TOKYO SEIMITSU CO LTD;

    申请/专利号JP20060206436

  • 发明设计人 TOMITA TOMIO;

    申请日2006-07-28

  • 分类号G01B5/20;

  • 国家 JP

  • 入库时间 2022-08-21 20:24:04

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号