首页> 外国专利> Semiconductor structure with multiple fins having different channel region heights and method of forming the semiconductor structure

Semiconductor structure with multiple fins having different channel region heights and method of forming the semiconductor structure

机译:具有具有不同沟道区高度的多个鳍的半导体结构及其形成方法

摘要

Disclosed are embodiments of a semiconductor structure with fins that are positioned on the same planar surface of a wafer and that have channel regions with different heights. In one embodiment the different channel region heights are accomplished by varying the overall heights of the different fins. In another embodiment the different channel region heights are accomplished by varying, not the overall heights of the different fins, but rather by varying the heights of a semiconductor layer within each of the fins. The disclosed semiconductor structure embodiments allow different multi-gate non-planar FETs (i.e., tri-gate or dual-gate FETs) with different effective channel widths to be formed of the same wafer and, thus, allows the beta ratio in devices that incorporate multiple FETs (e.g., static random access memory (SRAM) cells) to be selectively adjusted.
机译:公开了具有鳍片的半导体结构的实施例,鳍片位于晶片的同一平面上并且具有具有不同高度的沟道区。在一实施例中,通过改变不同鳍片的总高度来实现不同的通道区域高度。在另一个实施例中,通过改变而不是改变不同鳍的总高度,而是通过改变每个鳍内的半导体层的高度,来实现不同的沟道区高度。所公开的半导体结构实施例允许具有不同有效沟道宽度的不同多栅极非平面FET(即,三栅极或双栅极FET)由同一晶片形成,并且因此允许在结合有器件的器件中的β比。多个FET(例如静态随机存取存储器(SRAM)单元)进行选择性调整。

著录项

  • 公开/公告号US7781273B2

    专利类型

  • 公开/公告日2010-08-24

    原文格式PDF

  • 申请/专利权人 DOMINIC J. SCHEPIS;HUILONG ZHU;

    申请/专利号US20080127033

  • 发明设计人 DOMINIC J. SCHEPIS;HUILONG ZHU;

    申请日2008-05-27

  • 分类号H01L21/00;H01L21/84;H01L21/338;H01L21/337;H01L21/8234;H01L21/336;

  • 国家 US

  • 入库时间 2022-08-21 18:50:34

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号