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Design structure embodied in a machine readable medium for implementing SRAM cell write performance evaluation

机译:包含在机器可读介质中的用于实现SRAM单元写入性能评估的设计结构

摘要

A design structure embodied in a machine readable medium for implementing static random access memory (SRAM) cell write performance evaluation is provided. A SRAM core includes each wordline connected to only one bit column. A ring oscillator circuit is used to generate wordline pulses. A state machine controls operations for the SRAM cell write performance evaluation circuit including the ring oscillator circuit and the SRAM core. A control signal is applied to the state machine to select a first write operation, where the circuit simultaneously writes all the cells to a known state with wide wordlines to ensure all cells are written. Then a second write operation is selected, and all the wordlines are launched simultaneously to write the cells to the opposite state. From these write operations, a required wordline pulse width to write the cell is identified.
机译:提供了一种体现在机器可读介质中的设计结构,用于实现静态随机存取存储器(SRAM)单元写入性能评估。 SRAM内核包括每个仅连接到一位列的字线。环形振荡器电路用于产生字线脉冲。状态机控制用于包括环形振荡器电路和SRAM内核的SRAM单元写入性能评估电路的操作。将控制信号施加到状态机以选择第一写入操作,其中电路同时利用宽字线将所有单元写入已知状态,以确保所有单元都被写入。然后选择第二写入操作,并且同时启动所有字线以将单元写入相反的状态。从这些写入操作中,识别出写入单元所需的字线脉冲宽度。

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