首页> 外国专利> SEMICONDUCTOR DEVICE AND A METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE, CAPABLE OF SETTING TI CONCENTRATION OF A BARRIER METAL FILM AS OVER 0.1 AT AND BELOW 14 AT

SEMICONDUCTOR DEVICE AND A METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE, CAPABLE OF SETTING TI CONCENTRATION OF A BARRIER METAL FILM AS OVER 0.1 AT AND BELOW 14 AT

机译:半导体装置和制造半导体装置的方法,能够将阻挡金属膜的TI浓度设置为超过0.1 AT%且低于14 AT%

摘要

PURPOSE: A semiconductor device and a method of manufacturing a semiconductor device are provided to improve the reliability of a copper wire by combining a copper wire and a barrier metal film and reducing the resistance of the copper wiring.;CONSTITUTION: A trench is formed in an insulating layer(2). A barrier metal layer(3) is formed on the side and the bottom of the trench and is formed with the alloy of tantalum and titanium. A copper wire(4) is laminated on the barrier metal film and is located on the trench. The titanium concentration of the barrier metal film is over 0.1 at% and less 14 at%.;COPYRIGHT KIPO 2010
机译:目的:提供一种半导体器件及其制造方法,以通过结合铜线和阻挡金属膜并减小铜布线的电阻来提高铜线的可靠性。绝缘层(2)。阻挡金属层(3)形成在沟槽的侧面和底部,并由钽和钛的合金形成。铜线(4)层叠在阻挡金属膜上并位于沟槽上。阻挡金属膜的钛浓度超过0.1 at%且低于14 at%.; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100055317A

    专利类型

  • 公开/公告日2010-05-26

    原文格式PDF

  • 申请/专利权人 RENESAS ELECTRONICS CORPORATION;

    申请/专利号KR20090078657

  • 发明设计人 MOTOYAMA KOICHI;

    申请日2009-08-25

  • 分类号H01L21/3205;H01L21/768;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:42

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