PURPOSE: A wafer motherboard having a redundancy cell analysis function is provided so that it has an effect that a memory of amount can be analyzed without the remodeling of the memory tester by giving the redundancy cell analysis function to the wafer motherboard. CONSTITUTION: A wafer motherboard having the redundancy cell analysis function comprises a signal acquisition module(110), a comparator part, and an analysis section. A signal acquisition module gets a read signal which wafer outputs with the pattern signal which a test head(200) outputs to wafer. A comparator part compares a reference signal predetermining with a read signal inputted from the signal acquisition module. The cell information according to the comparison result is outputted. A storage stores the cell information which the comparator part outputs. The analysis section analyzes the cell information in case the memory is determined as the inferior goods.
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