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ATMOSPHERIC PRESSURE PLASMA ETCHING APPARATUS AND METHOD OF MANUFACTURING SOI SUBSTRATE

机译:大气压力等离子体刻蚀装置和制造SOI基质的方法

摘要

PROBLEM TO BE SOLVED: To provide an atmospheric pressure plasma etching apparatus capable of etching a workpiece well, and to combine manufacturing cost reduction of an SOI substrate and suppression of peeling.;SOLUTION: The atmospheric pressure plasma etching apparatus is provided with state detection means for detecting the state of a workpiece, and operation of the atmospheric pressure plasma etching apparatus is controlled according to the information detected by the state detection means. Etching can thereby be performed while detecting the state of the workpiece. Consequently, the workpiece can be etched well. When an SOI substrate is manufactured using the atmospheric pressure plasma etching apparatus, manufacturing cost reduction of the SOI substrate and suppression of peeling can be combined.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种大气压等离子体蚀刻装置,其能够很好地蚀刻工件,并且兼顾降低SOI衬底的制造成本和抑制剥离的问题。解决方案:大气压等离子体蚀刻装置具有状态检测装置。用于检测工件状态的装置,根据状态检测装置检测到的信息来控制大气压等离子体蚀刻装置的操作。由此可以在检测工件的状态的同时进行蚀刻。因此,可以很好地蚀刻工件。使用大气压等离子体蚀刻装置制造SOI基板时,可以兼顾降低SOI基板的制造成本和抑制剥离的效果。版权所有(C)2012,JPO&INPIT

著录项

  • 公开/公告号JP2012129510A

    专利类型

  • 公开/公告日2012-07-05

    原文格式PDF

  • 申请/专利权人 SEMICONDUCTOR ENERGY LAB CO LTD;

    申请/专利号JP20110252362

  • 发明设计人 SUZAWA HIDEOMI;ONUMA HIDETO;

    申请日2011-11-18

  • 分类号H01L21/3065;H01L27/12;H01L21/02;

  • 国家 JP

  • 入库时间 2022-08-21 17:41:22

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