首页> 外国专利> THROUGH SILICON VIA PROCESSING TECHNIQUES FOR LATERAL DOUBLE-DIFFUSED MOSFETS

THROUGH SILICON VIA PROCESSING TECHNIQUES FOR LATERAL DOUBLE-DIFFUSED MOSFETS

机译:硅通过横向双扩散MOSFET的加工技术

摘要

The present invention features a field effect transistor forming on a semiconductor substrate having formed thereon gate, source and drain regions, with said gate region having a lateral gate channel. A plurality of spaced-apart trenches each having an electrically conductive plug formed therein in electrical communication with said gate, source and drain regions, with said trenches extend from a back surface of said semiconductor substrate to a controlled depth. A trench contact shorts the source region and a body region. A source contact is in electrical communication with said source region and a drain contact in electrical communication with said drain region, with said source and drain contacts being disposed on opposite sides of said gate channel.
机译:本发明的特征在于一种场效应晶体管,其形成在其上形成有栅极,源极和漏极区域的半导体衬底上,其中所述栅极区域具有横向栅极沟道。多个间隔开的沟槽,每个沟槽中形成有与所述栅极,源极和漏极区电连通的导电塞,并且所述沟槽从所述半导体衬底的背面延伸至受控深度。沟槽接触使源极区和主体区短路。源极触点与所述源极区域电连通,并且漏极触点与所述漏极区域电连通,其中所述源极和漏极触点设置在所述栅极沟道的相对侧。

著录项

  • 公开/公告号US2012273878A1

    专利类型

  • 公开/公告日2012-11-01

    原文格式PDF

  • 申请/专利权人 SHEKAR MALLIKARJUNASWAMY;

    申请/专利号US201113095539

  • 发明设计人 SHEKAR MALLIKARJUNASWAMY;

    申请日2011-04-27

  • 分类号H01L29/78;H01L21/336;

  • 国家 US

  • 入库时间 2022-08-21 17:33:58

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