首页> 外国专利> METHOD FOR MACHINING NITRIDE SEMICONDUCTOR WAFER, NITRIDE SEMICONDUCTOR WAFER, PROCESS FOR PRODUCING NITRIDE SEMICONDUCTOR DEVICE, AND NITRIDE SEMICONDUCTOR DEVICE

METHOD FOR MACHINING NITRIDE SEMICONDUCTOR WAFER, NITRIDE SEMICONDUCTOR WAFER, PROCESS FOR PRODUCING NITRIDE SEMICONDUCTOR DEVICE, AND NITRIDE SEMICONDUCTOR DEVICE

机译:氮化物半导体晶片的加工方法,氮化物半导体晶片,制造氮化物半导体装置的方法以及氮化物半导体装置

摘要

A nitride semiconductor wafer is planar-processed by grinding a bottom surface of the wafer, etching the bottom surface by, e.g., KOH for removing a bottom process-induced degradation layer, chamfering by a rubber whetstone bonded with 100wt%-60wt% #3000-#600 diamond granules and 0wt%-40wt% oxide granules, grinding and polishing a top surface of the wafer, etching the top surface for eliminating a top process-induced degradation layer and maintaining a 0.5µm-10µm thick edge process-induced degradation layer.
机译:对氮化物半导体晶片进行平面加工,方法是研磨晶片的底面,然后用例如KOH蚀刻底面以去除底部的加工引起的降解层,并用结合有100wt%-60wt%#3000的橡胶磨刀石进行倒角。 -#600金刚石颗粒和0wt%-40wt%的氧化物颗粒,对晶片的顶部表面进行研磨和抛光,蚀刻该顶部表面以消除顶部工艺引起的降解,并保持0.5µm-10µm厚的边缘工艺引起的降解层。

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