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III-V semiconductor structures with diminished pit defects and methods for forming the same

机译:凹坑缺陷减少的III-V半导体结构及其形成方法

摘要

Embodiments relate to semiconductor structures and methods of forming them. In some embodiments, the methods may be used to fabricate semiconductor structures of III-V materials, such as InGaN. An In-III-V semiconductor layer is grown with an Indium concentration above a saturation regime by adjusting growth conditions such as a temperature of a growth surface to create a super-saturation regime wherein the In-III-V semiconductor layer will grow with a diminished density of V-pits relative to the saturation regime.
机译:实施例涉及半导体结构及其形成方法。在一些实施例中,该方法可以用于制造III-V族材料例如InGaN的半导体结构。通过调节生长条件(例如生长表面的温度),使In-III-V半导体层的铟浓度高于饱和状态,从而形成过饱和状态,其中In-III-V半导体层将随着铟的生长而生长。相对于饱和状态,V型凹坑的密度减小。

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