首页> 外国专利> BIPOLAR PUNCH-THROUGH SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SUCH A SEMICONDUCTOR DEVICE

BIPOLAR PUNCH-THROUGH SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SUCH A SEMICONDUCTOR DEVICE

机译:双极穿通型半导体装置及制造这种半导体装置的方法

摘要

A bipolar punch-through semiconductor device with a semiconductor substrate (1), which comprises at least a two-layer structure, one of the layers being a base layer (10) of the first conductivity type, is provided. The substrate comprises a first main side (11) with a first electrical contact (2) and a second main side (12) with a second electrical contact (3). A buffer layer (4) of the first conductivity type is arranged on the base layer (10). A first layer (5), which comprises alternately first regions (51, 51') of the first conductivity type and second regions (52, 52') of the second conductivity type, is arranged between the buffer layer (4) and the second electrical contact (3). The second regions (52, 52') are activated regions with a depth of at maximum 2 μm and a junction profile, which drops from 90 % to 10 % of the maximum doping concentration within at most 1 μm.
机译:提供一种具有半导体衬底(1)的双极穿通型半导体器件,该半导体器件至少包括两层结构,其中一层是第一导电类型的基础层(10)。衬底包括具有第一电触点(2)的第一主侧面(11)和具有第二电触点(3)的第二主侧面(12)。第一导电类型的缓冲层(4)布置在基础层(10)上。第一层(5)布置在缓冲层(4)和第二层之间,第一层(5)交替地包括第一导电类型的第一区域(51、51')和第二导电类型的第二区域(52、52')。电触点(3)。第二区域(52、52')是具有最大为2μm的深度和接合轮廓的激活区域,该接合轮廓从最大掺杂浓度的至多1μm内的最大掺杂浓度的90%下降到10%。

著录项

  • 公开/公告号EP2359404B1

    专利类型

  • 公开/公告日2015-01-14

    原文格式PDF

  • 申请/专利权人 ABB TECHNOLOGY AG;

    申请/专利号EP20090779699

  • 申请日2009-06-10

  • 分类号H01L29/08;H01L29/73;H01L29/74;H01L29/86;

  • 国家 EP

  • 入库时间 2022-08-21 15:08:02

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