首页> 外国专利> SPLIT GATE EMBEDDED MEMORY TECHNOLOGY AND METHOD OF MANUFACTURING THEREOF

SPLIT GATE EMBEDDED MEMORY TECHNOLOGY AND METHOD OF MANUFACTURING THEREOF

机译:分割门嵌入式存储器技术及其制造方法

摘要

Semiconductor devices and methods for forming a semiconductor device are disclosed. The method includes providing a substrate prepared with a memory cell region. A first gate structure is formed on the memory cell region. An isolation layer is formed on the substrate and over the first gate structure. A second gate structure is formed adjacent to and separated from the first gate structure by the isolation layer. The first and second gate structures are processed to form at least one split gate structure with first and second adjacent gates. Asymmetrical source and drain regions are provided adjacent to first and second sides of the split gate structure.
机译:公开了半导体器件和用于形成半导体器件的方法。该方法包括提供准备有存储单元区域的衬底。在存储单元区域上形成第一栅极结构。在衬底上和第一栅极结构上方形成隔离层。第二栅极结构通过隔离层与第一栅极结构相邻并与第一栅极结构分离。处理第一和第二栅极结构以形成具有第一和第二相邻栅极的至少一个分离式栅极结构。在分离栅结构的第一和第二侧面附近提供不对称的源极和漏极区域。

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