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RESISTIVE MEMORY DEVICE, MEMORY SYSTEM INCLUDING SAME AND METHOD FOR READING DATA IN RESISTIVE MEMORY DEVICE

机译:电阻型存储器,包括其的存储器系统以及用于读取电阻型存储器中的数据的方法

摘要

A resistive memory device comprises first and second resistive memory cells, a reference current generation unit, and first and second bit line sense amplifiers. The first and second resistive memory cells are connected to first and second bit lines, respectively. The reference current generation unit is connected to a first node and generates first and second reference currents to apply to the first node. The first bit line sense amplifier is connected to the first node and the first bit line, and senses first data stored in the first resistive memory cell based on a first sensing current which is generated based on the first and second reference currents. The second bit line sense amplifier is connected to the first node and the second bit line, and senses second data stored in the second resistive memory cell based on a second sensing current which is generated based on the first and second reference currents.;COPYRIGHT KIPO 2016
机译:电阻存储器件包括第一和第二电阻存储单元,参考电流产生单元以及第一和第二位线感测放大器。第一和第二电阻存储单元分别连接到第一和第二位线。参考电流产生单元连接到第一节点,并产生第一和第二参考电流以施加到第一节点。第一位线感测放大器连接到第一节点和第一位线,并且基于基于第一参考电流和第二参考电流产生的第一感测电流来感测存储在第一电阻存储单元中的第一数据。第二位线感测放大器连接到第一节点和第二位线,并基于第二感测电流感测存储在第二电阻存储单元中的第二数据,该第二感测电流是基于第一和第二参考电流而产生的。 2016年

著录项

  • 公开/公告号KR20160011890A

    专利类型

  • 公开/公告日2016-02-02

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20140093149

  • 发明设计人 KIM CHAN KYUNGKR;

    申请日2014-07-23

  • 分类号G11C11/15;G11C16/26;

  • 国家 KR

  • 入库时间 2022-08-21 14:15:09

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