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Dicing method for wafer level packaging and semiconductor chip having dicing structure adapted to wafer level packaging

机译:晶圆级封装的切割方法以及具有适合晶圆级封装的切割结构的半导体芯片

摘要

A semiconductor substrate (1) is provided with integrated circuits. Dicing trenches (7) are formed in the substrate (1) between the integrated circuits, a polyimide layer (8) spanning the trenches (7) is applied above the integrated circuits, a tape layer (14) is applied above the polyimide layer (8), and a layer portion of the substrate (1) is removed from the substrate side (17) opposite the tape layer (14), until the trenches (7) are opened and dicing of the substrate (1) is thus effected. The polyimide layer (8) is severed in sections (18) above the trenches (7) when the tape layer (14) is removed. The semiconductor chip is provided with a cover layer (11) laterally confining the polyimide layer (8) near the trenches (7), in particular for forming breaking delimitations (9).
机译:半导体衬底(1)设置有集成电路。在集成电路之间的衬底(1)中形成划片沟槽(7),跨越沟槽(7)的聚酰亚胺层(8)被施加在集成电路上方,带层(14)被施加在聚酰亚胺层上方(然后,如图8所示,从与带状层(14)相对的基板侧(17)上除去基板(1)的层部分,直到形成沟槽(7)并切割基板(1)为止。当去除带层(14)时,聚酰亚胺层(8)在沟槽(7)上方的部分(18)中被切断。半导体芯片具有覆盖层(11),该覆盖层在横向上将聚酰亚胺层(8)限制在沟槽(7)附近,特别是用于形成断裂边界(9)。

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