首页>
外国专利>
DA conversion circuit, defective bit number detection circuit, and non-volatile semiconductor memory device
DA conversion circuit, defective bit number detection circuit, and non-volatile semiconductor memory device
展开▼
机译:DA转换电路,缺陷位数检测电路以及非易失性半导体存储装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
PROBLEM TO BE SOLVED: To compensate an offset voltage VOFST in a DA conversion circuit using a switched capacitor circuit. A switched capacitor circuit including a first differential amplifier having an input circuit having a plurality of input capacitors for a plurality of input digital voltages, and DA conversion of the plurality of input digital voltages into an analog voltage. An offset cancel circuit including a second differential amplifier, which is a parallel integration type D / A conversion circuit for performing a first capacitor with a feedback circuit of the second differential amplifier short-circuited during a sampling period. The difference voltage between the output voltage of the first differential amplifier and the predetermined reference voltage is fed back to the inverting input terminal of the second differential amplifier, and the feedback circuit of the second differential amplifier operates during the hold period. The difference voltage between the reference voltage via the first capacitor and the reference voltage is input to the inverting input terminal of the first differential amplifier via the second capacitor without being short-circuited. [Selection diagram] Fig. 3
展开▼