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DA conversion circuit, defective bit number detection circuit, and non-volatile semiconductor memory device

机译:DA转换电路,缺陷位数检测电路以及非易失性半导体存储装置

摘要

PROBLEM TO BE SOLVED: To compensate an offset voltage VOFST in a DA conversion circuit using a switched capacitor circuit. A switched capacitor circuit including a first differential amplifier having an input circuit having a plurality of input capacitors for a plurality of input digital voltages, and DA conversion of the plurality of input digital voltages into an analog voltage. An offset cancel circuit including a second differential amplifier, which is a parallel integration type D / A conversion circuit for performing a first capacitor with a feedback circuit of the second differential amplifier short-circuited during a sampling period. The difference voltage between the output voltage of the first differential amplifier and the predetermined reference voltage is fed back to the inverting input terminal of the second differential amplifier, and the feedback circuit of the second differential amplifier operates during the hold period. The difference voltage between the reference voltage via the first capacitor and the reference voltage is input to the inverting input terminal of the first differential amplifier via the second capacitor without being short-circuited. [Selection diagram] Fig. 3
机译:解决的问题:使用开关电容器电路补偿DA转换电路中的失调电压VOFST。一种开关电容器电路,包括:第一差分放大器,其具有输入电路,该输入电路具有用于多个输入数字电压的多个输入电容器,并且将多个输入数字电压转换为模拟电压。一种包括第二差分放大器的偏移消除电路,该第二差分放大器是并行积分型D / A转换电路,用于在采样期间使第二差分放大器的反馈电路短路的情况下执行第一电容器。第一差分放大器的输出电压与预定参考电压之间的差分电压被反馈到第二差分放大器的反相输入端子,并且第二差分放大器的反馈电路在保持时段中操作。经由第一电容器的基准电压与基准电压之间的差电压经由第二电容器被输入至第一差分放大器的反相输入端子,而不会被短路。 [选择图]图3

著录项

  • 公开/公告号JP6694090B1

    专利类型

  • 公开/公告日2020-05-13

    原文格式PDF

  • 申请/专利号JP20190037523

  • 发明设计人 木谷 朋文;

    申请日2019-03-01

  • 分类号H03M1/74;G11C7/16;G11C16/34;

  • 国家 JP

  • 入库时间 2022-08-21 11:34:45

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