首页> 外国专利> Semiconductor device including laterally diffused metal-oxide-semiconductor field effect transistor and method for manufacturing the same

Semiconductor device including laterally diffused metal-oxide-semiconductor field effect transistor and method for manufacturing the same

机译:包括横向扩散的金属氧化物半导体场效应晶体管的半导体器件及其制造方法

摘要

According to one embodiment, a semiconductor device includes a semiconductor device includes a first semiconductor region, a second semiconductor region, a third semiconductor region, an insulating unit, a void, a gate insulating film and a gate electrode. The second semiconductor region provides on a part of the first semiconductor region. The third semiconductor region provides on one other part of the first semiconductor region. The insulating unit provides on a part of the second semiconductor region. The void provides at a lower part of the insulating unit. The gate insulating film provides on a part of the first semiconductor region between the second semiconductor region and the third semiconductor region. The gate electrode provides on the gate insulating film. A position in a first direction of at least a part of the void is between the insulating unit and the third semiconductor region.
机译:根据一个实施例,一种半导体器件包括一种半导体器件,该半导体器件包括第一半导体区域,第二半导体区域,第三半导体区域,绝缘单元,空隙,栅绝缘膜和栅电极。第二半导体区域在第一半导体区域的一部分上提供。第三半导体区域在第一半导体区域的另一部分上提供。绝缘单元设置在第二半导体区域的一部分上。该空隙提供在绝缘单元的下部。栅极绝缘膜设置在第二半导体区域和第三半导体区域之间的第一半导体区域的一部分上。栅电极设置在栅绝缘膜上。空隙的至少一部分的在第一方向上的位置在绝缘单元和第三半导体区域之间。

著录项

  • 公开/公告号US10727333B2

    专利类型

  • 公开/公告日2020-07-28

    原文格式PDF

  • 申请/专利权人 KABUSHIKI KAISHA TOSHIBA;

    申请/专利号US201715407371

  • 发明设计人 HIROFUMI NAGANO;KOICHI OZAKI;

    申请日2017-01-17

  • 分类号H01L29/66;H01L29/78;H01L29/06;H01L29/10;H01L21/324;

  • 国家 US

  • 入库时间 2022-08-21 11:28:22

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