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One-time programmable bitcell with diode under anti-fuse

机译:具有二极管的一次性可编程位单元在反熔丝下

摘要

A one-time programmable memory device includes a first doped region in a semiconductor substrate, a second doped region implanted within the first doped region, and a gate positioned over the second doped region. The first doped region and second doped regions form a diode. A first contact is coupled to the first doped region for applying a voltage to the first doped region. The gate includes a dielectric portion that is capacitively coupled to the second doped region. The gate also includes a conductive portion that is coupled to a second contact for applying a voltage to the conductive portion. The voltage applied to the conductive portion is independent from the voltage applied to the first doped region. The memory device is programmed by forming a rupture in the dielectric portion of the gate.
机译:一次性可编程存储器件包括:半导体衬底中的第一掺杂区域;注入在第一掺杂区域内的第二掺杂区域;以及位于第二掺杂区域上方的栅极。第一掺杂区和第二掺杂区形成二极管。第一接触耦合到第一掺杂区域,用于向第一掺杂区域施加电压。栅极包括电介质部分,该电介质部分电容性地耦合到第二掺杂区。栅极还包括导电部分,该导电部分耦合到第二接触,用于向导电部分施加电压。施加到导电部分的电压独立于施加到第一掺杂区的电压。通过在栅极的介电部分中形成破裂来对存储器件进行编程。

著录项

  • 公开/公告号US10529436B1

    专利类型

  • 公开/公告日2020-01-07

    原文格式PDF

  • 申请/专利权人 SYNOPSYS INC.;

    申请/专利号US201815872673

  • 发明设计人 HRANT SARGSYAN;ANDREW E. HORCH;

    申请日2018-01-16

  • 分类号G11C17/16;H01L27/112;H01L23/525;H01L29/06;H01L29/45;G11C17/18;H01L29/861;

  • 国家 US

  • 入库时间 2022-08-21 11:19:00

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