Institute of Modern Physics;
Chinese Academy of Sciences;
University of Chinese Academy of Sciences;
School of Physical Science and Technology;
Lanzhou University;
Academy of Shenzhen State Microelectronic Co.;
Ltd.;
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory;
Anti-fuse; PROM; Single; event; effects; Heavy; ions; Pulsed; laser; Space; error; rate;