首页> 外文OA文献 >Investigation of Laser-fired Rear-side Point Contacts of Laser-crystallized Silicon Thin-film Solar Cells by Conductive Probe Atomic Force Microscopy

【2h】

Investigation of Laser-fired Rear-side Point Contacts of Laser-crystallized Silicon Thin-film Solar Cells by Conductive Probe Atomic Force Microscopy

机译：导电探针原子力显微镜研究激光结晶的硅薄膜太阳能电池的激光发射后侧点接触

代理获取

本网站仅为用户提供外文OA文献查询和代理获取服务，本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文，但由于OA文献来源多样且变更频繁，仍可能出现获取不到、文献不完整或与标题不符等情况，如果获取不到我们将提供退款服务。请知悉。

页面导航

著录项
引文网络
相似文献
相关主题

著录项

作者
Gref O.; Sandström J.; Weizman M.; Rhein H.; Gall S.; Schlatmann R.; Boit C.; Friedrich F.;
展开▼
作者单位

展开▼
年度 2014
总页数
原文格式 PDF
正文语种
中图分类

相似文献

外文文献
中文文献
专利

1. Investigation of laser-fired point contacts on KOH structured laser-crystallized silicon by conductive atomic force microscopy [J] . Gref Orman, Weizman Moshe, Rhein Holger, Applied Surface Science . 2016,第Juna30期

机译：导电原子力显微镜研究KOH结构激光结晶硅上的激光点火点接触
2. Investigation of electronic transport through ultrathin carbon nanomembrane junctions by conductive probe atomic force microscopy and eutectic Ga-In top contacts [J] . Xianghui Zhang, Emanuel Marschewski, Paul Penner, Journal of Applied Physics . 2017,第5期

机译：通过导电探针原子力显微镜和共晶Ga-In顶部触点研究通过超薄碳纳米膜结的电子传输
3. Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination [J] . Paul Narchi, Jose Alvarez, Pascal Chrétien, Nanoscale Research Letters . 2016,第1期

机译：开尔文和导电探针原子力显微镜对外延硅太阳能电池的横断面研究：照明的影响
4. Investigation of laser-fired rear-side point contacts of laser-crystallized silicon thin-film solar cells by conductive probe atomic force microscopy [C] . O. Gref, J. Sandstrom, M. Weizman European Materials Research Society Symposium . 2015

机译：通过导电探针原子力显微镜进行激光结晶硅薄膜太阳能电池激光触发后侧触点的研究
5. Nanoscale fabrication and characterization of chemically modified silicon surfaces using conductive atomic force microscopy in liquids. [D] . Kinser, Christopher Reagan. 2005

机译：使用液体中的导电原子力显微镜对化学修饰的硅表面进行纳米级制造和表征。
6. Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination [O] . Paul Narchi, Jose Alvarez, Pascal Chrétien, 2016

机译：开尔文和导电探针原子力显微镜对外延硅太阳能电池的横断面研究：照明的影响
7. Cross-Sectional Investigations on Epitaxial Silicon Solar Cells by Kelvin and Conducting Probe Atomic Force Microscopy: Effect of Illumination [O] . Narchi, Paul, Alvarez, José, Chrétien, Pascal, 2016

机译：开尔文和导电探针原子力显微镜对外延硅太阳能电池的横断面研究：照明的影响
8. Cross-Sectional Conductive Atomic Force Microscopy of CdTe/CdS Solar Cells: Effects of Etching and Back-Contact Processes. Preprint [R] . Moutinho, H. R. 2006

机译：CdTe / Cds太阳能电池的横截面导电原子力显微镜：蚀刻和背接触过程的影响。预印本

Investigation of Laser-fired Rear-side Point Contacts of Laser-crystallized Silicon Thin-film Solar Cells by Conductive Probe Atomic Force Microscopy

著录项

引文网络

相似文献

相关主题

期刊订阅