首页> 美国政府科技报告 >Low Energy Ion Microprobe Facility for Maskless Machining Trials
【24h】

Low Energy Ion Microprobe Facility for Maskless Machining Trials

机译:低能量离子微探针设备,用于无掩模加工试验

获取原文

摘要

A system for maskless ion beam machining was constructed to evaluate the advantages of this technique over conventional flood beam ion etching. Erosion is through impact with a finely focused beam of 8 to 9keV In(+) ions produced by a liquid metal ion microprobe. Points on the sample surface are addressed by a low cost computer controlled scan generator. Although machining trials are carried out under normal high vacuum conditions, the modular construction and long working distance of the microprobe make it a suitable design for reactive gas environments. End-point detection is possible through observation of the collected stage current and/or the output from a charge particle detector. Tests demonstrate the ability of the machine to solve a number of materials preparation problems. The column, by virtue of its constant current density characteristic, is particularly suited to relatively large area machining. The versatility of the microprobe would be greatly enhanced by the addition of a preaperture change mechanism.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号