ANALYSIS OF TANTALUM METAL FOR TRACE AMOUNTS OF NIOBIUM BY ENERGY-DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRY

摘要

A nondestructive method is described for quantitatively measuring trace amounts (0-500 ppm) of niobium in tantalum-niobium alloy sheets, turnings, and fabricated parts. The method, which makes use of an energy-dispersive x-ray spectrometer to compare the sample to be analyzed against known standard samples, can detect niobium levels as low as 10 ppm.