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Investigation of Normal Incidence High-Performance P-type Strained LayerInGaAs/AlGaAs and GaAs/AlGaAs Quantum Well Infrared Photodetectors

机译:正常入射高性能p型应变层InGaas / alGaas和Gaas / alGaas量子阱红外光电探测器的研究

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The objective of this project is to perform theoretical and experimental studiesof dark current, photocurrent, optical absorption, spectral responsivity, noise, and detectivity for the normal incidence strained layer p-type III-V semiconductor quantum well infrared photodetectors (QWIPs) developed under this program. The material systems under investigation include InGaAs/InAlAs on InP substrates and GaAs/InGaAs or AlGaAs/InGaAs on GaAs substrates. The project will study the usage and effects of biaxial tension and compressional strain on the material systems and their effects towards photodetector design. jg.

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