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Low-Dose n-Type Ion Implantation into Cr-Doped GaAs Substrates.

机译:低剂量n型离子注入Cr掺杂Gaas衬底。

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摘要

Some results of low-dose Se(+) implants into several different Cr-doped ingots are presented. These results illustrate the substrate-related variations that are generally observed; methods of reducing or eliminating these substrate effect are presented. (Author)

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