Storage Reliability of Missile Materiel (Accelerated Testing of Patriot System Electronic Components).

摘要

Samples of 200 each of 21 different parts, planned for use in the PATRIOT missile system, were subjected to a comprehensive test program to determine their storage reliability potential. The test parts included beam lead and chip and wire integrated circuits, transistors, diodes, resistors, capacitors, inductors, and a ceramic substrate. The report documents the testing approach used; detailed test results on each part type; detailed analysis of the test data; failure analysis results of failed parts, including failure modes, failure mechanisms, and cause of failure. High temperature and applied electrical bias were employed as accelerating factors in the testing, and both the Arrhenius and Eyring reaction rate models were employed in analysis of the data. Conclusions and recommendations relative to the storage reliability potential of each part type tested in the program are derived and documented.