Comparison Study of the Five Transistor-Transistor-Logic (TTL) Families and Emitter Coupled Logic (ECL).

摘要

This report describes the radiation test response of the five transistor-transistor-logic (TTL) technologies and the emitter-coupled-logic (ECL) technology. The five TTL technologies evaluated were Standard, High Speed, Low Power, Low Power Schottky, and Schottky. Quad dual input NAND (TTL) or NOR (ECL) gates and dual D flip-flops from each technology were tested. The devices were characterized for gamma dose-rate logic upset, total gamma dose survivability, and neutron fluence survivability. The data has been analyzed to provide a comparison of each logic technology's radiation response. (Author)