State-of-the-Art Assessment of Testing and Testability of Custom LSI/VLSI Circuits. Volume VII. Built-In Testing (BIT) and Built-In Test Equipment (BITE).

摘要

Concurrent testing and nonconcurrent testing are the two major BIT techniques employed in VSLI circuit design; concurrent testing and nonconcurrent testing. concurrent testing allows circuit checkout during normal system; and may employ error detecting codes, self checking circuits, replication or electrical monitoring. Nonconcurrent testing requires a special test mode during which normal system operation is halted. Circuits must be added to generate the test patterns used during test mode. Circuits must be added to generate the test patterns used during test mode. Nonconcurrent testing is initiated by hardware implemented BITE or diagnostic software. (Author)