Built-in test circuitry and speed test methods that provide simple and accurate AC testing of digital microcircuits using low-bandwidth test equipment and probe stations

摘要

The invention relates to a method and system for transferring data between an integrated circuit (ATE) and an integrated circuit in accordance with a low-speed clock, which may have an arbitrarily long period, Circuit and technique for operating a storage element in an integrated circuit in accordance with a high-speed clock having the same. In one embodiment, the input latches at the inputs of the integrated circuit receive the test data from the ATE, and the output latches at the outputs provide the test result data to the ATE. According to an alternating single cycle of the low speed clock and the high speed clock, the delay through the combinational network between the data transmission paths between the input latch and the output latch is checked according to the high speed clock. In another embodiment, the test data is serially scanned into a scan register in accordance with a series of slow clock cycles. After the scan data is scanned, the scan registers are operated in parallel to check the delay of the combinational network between them.