首页> 美国政府科技报告 >Studies of the Electronic Properties of Two-Dimensionally Confined Carriers in MIS (Metal-Insulator-Semiconductor) Inversion/Accumulation Layers, Heterojunctions and Quantum Wells.
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Studies of the Electronic Properties of Two-Dimensionally Confined Carriers in MIS (Metal-Insulator-Semiconductor) Inversion/Accumulation Layers, Heterojunctions and Quantum Wells.

机译:mIs(金属 - 绝缘体 - 半导体)反转/累积层,异质结和量子阱中二维受限载流子的电子性质研究。

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摘要

This report states the results of several investigations of the one and many electron transport, magneto-transport, optical and magneto-optical properties of quasi two-dimensionally confined charge carriers realized in metal-insulator-semiconductor (MIS) inversion or accumulation layers, heterojunctions, and multiple, isolated or coupled, quantum well structures involving III-V compound semiconductors and their alloys.

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