Cognitive Speed and Performance in Basic Electricity and Electronics (BE&E) School.

摘要

A battery of cognitive speed tests was programmed for administration via microcomputer and given to 155 entering students at the BE&E school, Naval Training Center, San Diego. The tests measured (1) reaction time, the time in milliseconds, it takes a subject to respond to simple and complex stimuli, and (2) inspection time, the shortest time, in milliseconds, a subject needs to discriminate which of two briefly presented lines is longer. The substantial relationships found between cognitive speed test scores and rate of progress in the self-paced BE&E course support of the continued investigation of cognitive speed tests as a potentially useful predictor of technical school performance.