Design of a Wafer-Scale Focal Plane Processor

摘要

This report describes a wafer-scale design for an infrared focal plane processor (FPP) to operate in a space environment. The functions of a generic focal plane processor are described, followed by a detailed discussion of a design to be implemented in RVLSI wafer-scale technology for a space-based application. A prototype of this processor (PFPP) will actually be fabricated in rad-hard silicon-on-insulator 3-micrometers technology. Finally, the question of reliability is explored, and a philosophy of fault tolerance is presented which will lead to a reasonable probability of success over a five-year lifetime. Keywords include: Focal plane processor, Infrared detector, Wafer-scale integration, VLSI, Time-dependant Fault tolerance, and Image processors. (RH)