首页> 美国政府科技报告 >Molecular Beam Epitaxial Growth, Characterization and Electronic Device Processing of HgCdTe, HgZnTe, Related Heterojunctions and HgCdTe-CdTe Superlattices.
【24h】

Molecular Beam Epitaxial Growth, Characterization and Electronic Device Processing of HgCdTe, HgZnTe, Related Heterojunctions and HgCdTe-CdTe Superlattices.

机译:HgCdTe,HgZnTe,相关异质结和HgCdTe-CdTe超晶格的分子束外延生长,表征和电子器件加工。

获取原文

摘要

The research program on the growth by Molecular Beam Epitaxy of Hg-based alloys and heterostructures carried out in the Microphysics Laboratory at the University of Illinois at Chicago and supported by this contract has been extremely successful. Tremendous progress has been achieved towards the improvement of HgCdTe and related heterostructures in terms of structural, electrical and optical properties. A very important step has been passed through in the control of the twinning process during the growth in the (111)B orientation. Furthermore, it has been clearly established for the first time that twins or related dislocations are acting as acceptors in HgCdTe and are detrimental for diode performance, what was suspected but never proved until our conclusive experiments.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号