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Hot electron energy loss rates in GaAs/GaAlAs multiple quantum wells: effects of finite barrier height and well width

机译:GaAs / GaAlAs多量子阱中的热电子能量损失率:有限势垒高度和阱宽度的影响

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Hot electron energy loss rate has been studied in GaAs/GaAlAs multiple quantum wells in the electron temperature range 3.3-15.0 K where electron-acoustic phonon interaction dominates. Calculations are presented for power loss by incorporating the finite barrier height and screened interaction. An excellent agreement between our calculations and the experimental data of Celik et al. [Semicond. Sci. Technol. 17 (2002) 18] a d Cankurtaran et al. [Phys. Stat. Sol. (b) 229 (2002) 1191] for quantum wells with widths in the range 51-140 A and base lattice temperature in the range 1.7-5.9 K is obtained. The analysis of the data, apart from demonstrating the importance of finite barrier height, has also brought out the relative importance of the contribution to power loss due to deformation potential and piezoelectric scatterings. The values deduced for the deformation potential constant Ed lie in the range 7.5-12.5 eV, in contrast to the large scatter in its values, usually observed in the literature. The need for more experimental data, for well widths less than 40 Angstrom, and higher than 140 Angstrom, is pointed out for a better understanding of well width dependence of electron energy loss rate. (C) 2003 Elsevier B.V. All rights reserved. [References: 28]
机译:在电子声声子相互作用占主导地位的电子温度范围为3.3-15.0 K的GaAs / GaAlAs多量子阱中研究了热电子能量损失率。通过结合有限的势垒高度和屏蔽相互作用,给出了功率损耗的计算。我们的计算与Celik等人的实验数据之间的极好的一致性。 [中。科学技术。 17(2002)18] a d Cankurtaran等。 [物理统计索尔(b)229(2002)1191]获得了宽度在51-140 A范围内且基础晶格温度在1.7-5.9 K范围内的量子阱。对数据的分析,除了说明有限势垒高度的重要性外,还指出了由于形变势能和压电散射而导致的功率损耗的相对重要性。与通常在文献中观察到的值的大分散相反,为变形势常数Ed推导的值在7.5-12.5 eV的范围内。指出需要更多的实验数据,以用于小于40埃且大于140埃的阱宽度,以更好地理解电子能量损失率的阱宽度依赖性。 (C)2003 Elsevier B.V.保留所有权利。 [参考:28]

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