...
首页> 外文期刊>Semiconductors >Specific features of the photoluminescence of HEMT nanoheterostructures containing a composite InAlAs/InGaAs/InAs/InGaAs/InAlAs quantum well
【24h】

Specific features of the photoluminescence of HEMT nanoheterostructures containing a composite InAlAs/InGaAs/InAs/InGaAs/InAlAs quantum well

机译:包含复合InAlAs / InGaAs / InAs / InGaAs / InAlAs量子阱的HEMT纳米异质结构的光致发光的特定特征

获取原文
获取原文并翻译 | 示例

摘要

The specific features of the photoluminescence and the electrical properties of doped nanoheterostructures containing a composite InAlAs/InGaAs/InAlAs quantum well with a thin InAs insert in the middle are studied. The insert thickness is varied in the range from 1.7 to 3.0 nm. It is established that the position of the peaks in the photoluminescence spectra in the photon energy range 0.6-0.8 eV correlates with the InAs insert thickness. Simulation of the band structure shows that the experimentally observed variation in the energy of optical transitions is associated with lowering of the energy of electron and hole states in the quantum well with increasing insert thickness. In the photon energy range 1.24-1.38 eV, optical transitions in the region of the InAlAs buffer-InP substrate interface are observed. The signal photon energy and intensity depend on the features of the formation of this heterointerface and on the conditions of substrate annealing. It is conceived that this is due to the formation of a transition region between the InAlAs buffer and the substrate.
机译:研究了光致发光的特殊特征和掺杂的纳米异质结构的电学特性,该结构包含中间有一个薄InAs插入物的复合InAlAs / InGaAs / InAlAs量子阱。插入件的厚度在1.7至3.0 nm的范围内变化。可以确定,在光子能量范围为0.6-0.8 eV的光致发光光谱中,峰的位置与InAs插入层厚度相关。能带结构的仿真表明,实验观察到的光学跃迁能量的变化与插入层厚度增加时量子阱中电子和空穴态能量的降低有关。在1.24-1.38 eV的光子能量范围内,可以观察到InAlAs缓冲液-InP衬底界面区域的光学跃迁。信号光子的能量和强度取决于该异质界面形成的特征以及衬底退火的条件。可以认为这是由于在InAlAs缓冲液和衬底之间形成了过渡区。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号