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High-mobility and low-power thin-film transistorsbased on multilayer mos2 crystals

机译:基于多层mos2晶体的高迁移率和低功耗薄膜晶体管

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Unlike graphene, the existence of bandgaps (1–2eV) in the layered semiconductor molybdenumdisulphide, combined with mobility enhancement by dielectric engineering, offers an attractivepossibility of using single-layer molybdenum disulphide field-effect transistors in low-powerswitching devices. However, the complicated process of fabricating single-layer molybdenumdisulphide with an additional high-k dielectric layer may significantly limit its compatibilitywith commercial fabrication. Here we show the first comprehensive investigation of processfriendly multilayer molybdenum disulphide field-effect transistors to demonstrate a compelling case for their applications in thin-film transistors. our multilayermolybdenum disulphidefield-effect transistors exhibited high mobilities (>100cm2V~(-1)s~(-1)), near-ideal subthreshold swings (-70mV per decade) and robust current saturation over a large voltage window. With simulations based on shockley’s long-channel transistor model andcalculations of scatteringmechanisms, these results provide potentially important implications in the fabrication of highresolution large-area displays and further scientific investigation of various physical propertiesexpected in other layered semiconductors.
机译:与石墨烯不同,层状半导体二硫化钼中的带隙(1-2eV)的存在,再加上介电工程的迁移率提高,提供了在低功率开关器件中使用单层二硫化钼场效应晶体管的诱人可能性。但是,制造具有附加的高k介电层的单层二硫化钼的复杂过程可能会大大限制其与商业生产的兼容性。在这里,我们展示了对工艺友好的多层二硫化钼场效应晶体管的首次全面研究,以证明其在薄膜晶体管中的令人信服的案例。我们的多层二硫化钼场效应晶体管表现出高迁移率(> 100cm2V〜(-1)s〜(-1)),接近理想的亚阈值摆幅(每十年-70mV)以及在大电压范围内稳定的电流饱和度。借助基于Shockley的长沟道晶体管模型的仿真和散射机制的计算,这些结果可能对高分辨率大面积显示器的制造以及其他层状半导体中预期的各种物理性质的进一步科学研究产生潜在的重要影响。

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