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首页> 外文期刊>Microelectronics international: Journal of ISHM--Europe, the Microelectronics Society--Europe >Towards a better understanding of underfill encapsulation for flip chip technology: proposed developments for the future
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Towards a better understanding of underfill encapsulation for flip chip technology: proposed developments for the future

机译:更好地了解倒装芯片技术的底部填充封装:未来的拟议发展

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Most flip chip assemblies require underfill to bestow reliability that would otherwise be ravished by stress due to thermomechanical mismatch between die and substrate. While underfill can be viewed as "polymer magic" and the key to modern flip chip success, many see it as the process "bottleneck" that must be eliminated in the future. Both views are accurate. A substantial amount of R&D is being focused on making underfill more user-friendly. Electronic materials suppliers, various consortia, government labs and university researchers are working diligently to shatter the bottleneck and fully enable flip chip - the final destination for micropackaging. This paper will describe these efforts and provide a status report on state-of-the-art underfill technologies. We will also examine new processing strategies.
机译:大多数倒装芯片组件需要底部填充以赋予可靠性,否则,由于芯片和基板之间的热机械失配,应力会破坏可靠性。虽然底部填充可视为“聚合物魔术”和现代倒装芯片成功的关键,但许多人将其视为将来必须消除的“瓶颈”工艺。两种观点都是正确的。大量的研发工作集中在使底部填充更加用户友好。电子材料供应商,各种财团,政府实验室和大学研究人员正在努力工作,以消除瓶颈并完全启用倒装芯片-微型封装的最终目的地。本文将描述这些工作,并提供有关最新的底部填充技术的状态报告。我们还将研究新的处理策略。

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