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Underfill process development for lead free flip chip assembly.

机译:用于无铅倒装芯片组装的底部填充工艺开发。

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摘要

Underfills are used to enhance the long-term reliability of the flip-chip solder joints. More specifically, the function of the underfill is to couple the chip to the substrate, wherein the shear stresses experienced by the solder joints are converted to bending stresses. The underfill flows under the die due to the influence of strong capillary forces. The flow of the underfill under the chip depends on various factors such as the viscosity of the underfill, contact angle, surface tension, temperature, underfill gap, substrate design, bump pattern, bump density, and size of the chip. The flow of underfill is also influenced by the cleanliness of the substrate, the cleanliness of the underside of the chip, and the flux residues. The interaction between the underfill and the substrate affects not only gap filling, but also the filleting of the underfill. Similarly, the underfill-flux interaction directly affects the quality of underfilling and the reliability of the flip chip assembly. In the case of lead free flip chip assembly, the major concerns vis-a-vis process development for a large chip with a small bump pitch (less than 190 mum) include lower throughput, voiding under the chip, and critical reliability performance.; The principal objective of this research endeavor was to investigate the fundamental issues that relate to the process and reliability aspects of underfilling of lead free flip chip assemblies. In order to develop a robust underfilling process, the effect of different process parameters and their interaction with the material properties were studied. In order to improve the compatibility between the underfill and the flux, a new epoxy flux that was compatible with the lead free assembly process was developed. The performance of the epoxy was also compared with the performance of various rosin based fluxes. This study also helped in identifying the critical parameters that can affect the assembly yields. This research endeavor successfully contributed towards defining dispensing process windows for the underfills that were compatible with the lead free process. In conclusion, the proposed research contributed towards the development of the fundamental understanding of the capillary underfilling process for lead free flip chip assemblies.
机译:底部填充材料用于增强倒装芯片焊点的长期可靠性。更具体地,底部填充的功能是将芯片耦合至基板,其中,焊点所经受的剪切应力被转换为弯曲应力。由于强大的毛细作用力,底部填充剂在模具下流动。底部填充剂在芯片下方的流动取决于各种因素,例如底部填充剂的粘度,接触角,表面张力,温度,底部填充剂间隙,基板设计,凸点图案,凸点密度和芯片尺寸。底部填充剂的流动还受到基材清洁度,芯片下侧清洁度和助焊剂残留量的影响。底部填充胶与基材之间的相互作用不仅影响间隙填充,而且影响底部填充胶的圆角化。同样,底部填充-助焊剂相互作用直接影响底部填充的质量和倒装芯片组件的可靠性。在无铅倒装芯片组装的情况下,针对具有小凸块间距(小于190微米)的大型芯片,工艺开发的主要关注点包括较低的生产率,芯片下方的空隙以及关键的可靠性能。这项研究工作的主要目的是研究与无铅倒装芯片组件的底部填充工艺和可靠性有关的基本问题。为了开发可靠的底部填充工艺,研究了不同工艺参数的影响及其与材料性能的相互作用。为了提高底部填充剂和助焊剂之间的相容性,开发了一种与无铅装配工艺兼容的新型环氧助焊剂。还将环氧树脂的性能与各种松香基助焊剂的性能进行了比较。这项研究还有助于确定可能影响组装良率的关键参数。这项研究工作成功地为定义了与无铅工艺兼容的底部填充的分配工艺窗口做出了贡献。总而言之,所提出的研究有助于发展对无铅倒装芯片组件的毛细管底部填充工艺的基本理解。

著录项

  • 作者

    Chaware, Raghunandan.;

  • 作者单位

    State University of New York at Binghamton.;

  • 授予单位 State University of New York at Binghamton.;
  • 学科 Engineering System Science.; Engineering Materials Science.
  • 学位 Ph.D.
  • 年度 2004
  • 页码 257 p.
  • 总页数 257
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 系统科学;工程材料学;
  • 关键词

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