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Preparation of sacrificial layer for MEMS devices by lift-off technology

机译:利用剥离技术制备MEMS器件牺牲层

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摘要

To simplify the preparation of sacrificial layer in micro-electromechanical system structure, new processes have been developed. By using lift-off technology, sacrificial layer was selectively deposited into the pit that prepared for sacrificial layer releasing. Then a short time polishing process was used to remove the burrs around the pit. This method offers several advantages including reducing the difficulty of polishing and hence processing cost. Methods and apparatuses to provide a continuously smoothly sacrificial layer surface in the pit were disclosed. However, it is important to control the homogeneity of filling and avoid the shadow effect at the corner of the pit. The unpadded regions would form a steep step and cause the cracking of structure layer. This problem was discussed and solved by rotating the tilted wafer during sacrificial material deposition. The surface roughness after the preparation process of sacrificial layer was measured. The root mean square roughness of sacrificial layer was 1.247 nm and reduced to 0.861 nm after a short time polishing process. Finally, a film bulk acoustic wave resonator with stacked Mo/AlN/Mo films had been fabricated on the sacrificial layer based on this method.
机译:为了简化微机电系统结构中牺牲层的制备,已经开发了新的工艺。通过使用剥离技术,将牺牲层选择性地沉积到准备释放牺牲层的凹坑中。然后使用短时间的抛光工艺去除凹坑周围的毛刺。该方法具有几个优点,包括减少抛光的难度并因此降低了加工成本。公开了在凹坑中提供连续平滑的牺牲层表面的方法和设备。但是,重要的是控制填充的均匀性并避免凹坑拐角处的阴影效应。未填充区域会形成陡峭的台阶,并导致结构层开裂。通过在牺牲材料沉积过程中旋转倾斜的晶圆来讨论并解决此问题。测量牺牲层的制备过程之后的表面粗糙度。牺牲层的均方根粗糙度为1.247 nm,经过短时抛光后降低至0.861 nm。最后,基于该方法,在牺牲层上制造了具有堆叠的Mo / AlN / Mo膜的膜体声波谐振器。

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