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Bondability of Copper Joints Formed Using a Mixed Paste of Ag_2O and CuO for Low-Temperature Sinter Bonding

机译:用Ag_2O和CuO的混合糊剂形成的低温烧结铜接头的粘结性。

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The bondability of copper joints formed using a mixed paste of silver oxide (Ag_2O) and copper oxide (CuO) that contained reducing solvents was evaluated in order to achieve bonds that exhibited high migration tolerance and could serve as Pb-free alternatives to the conventional bonds formed using high-melting point solders in electronics packaging. The Ag_2O particles reduced into silver nanoparticles at 150°C, whereas the CuO reduced into copper nanoparticles about 300°C. The joints formed using the Ag_2O/CuO mixed paste, when heated to the appropriate levels, exhibited bondability superior to that of conventional Pb-5Sn joints. The oxide film formed on the copper substrate was reduced by the combustion of polyethylene glycol 400, and bonding was achieved between the sintered layer and the copper substrate. A longer period resulted in the oxidisation of a few layers of sintered copper layers into Gu_2O. The ion-migration tolerance of the Ag_2O/CuO mixed paste
机译:对使用包含还原溶剂的氧化银(Ag_2O)和氧化铜(CuO)的混合浆料形成的铜接头的可粘合性进行了评估,以实现具有高迁移耐受性且可作为常规键的无铅替代品的键在电子封装中使用高熔点焊料形成。在150℃下,Ag_2O颗粒还原为银纳米颗粒,而在300℃左右,CuO还原为铜纳米颗粒。使用Ag_2O / CuO混合糊料形成的接头在加热到适当水平时,表现出的粘结性优于传统的Pb-5Sn接头。通过聚乙二醇400的燃烧减少了形成在铜基板上的氧化膜,并且在烧结层和铜基板之间实现了结合。较长的时间导致几层烧结铜层氧化成Gu_2O。 Ag_2O / CuO混合浆料的离子迁移容限

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