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A simple transmission-based approach for determining the thickness of transparent films

机译:一种基于透射的简单方法来确定透明膜的厚度

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We demonstrate that the thickness of a polymer film may be determined by a simple analysis of the interference fringes observed in a transparent region of its transmission spectrum. By measuring the transmission spectrum of the uncoated substrate in the same wavelength region, we can determine the dispersion of the refractive index for the substrate and film and the thickness of the film, without prior knowledge of the optical constants of any of the materials. The results of our approach agree with measurements obtained by a direct contact method. This analysis provides a fast, simple, and nondestructive method of thickness measurement using equipment available in many teaching laboratories. The method enables students to make routine thickness measurements while introducing them to refractive index dispersion, Fresnel coefficients, thin film interference, and regression analysis.
机译:我们证明,可以通过对在其透射光谱的透明区域中观察到的干涉条纹的简单分析来确定聚合物膜的厚度。通过测量相同波长区域中未涂覆基材的透射光谱,我们可以确定基材和薄膜的折射率的色散以及薄膜的厚度,而无需事先了解任何材料的光学常数。我们方法的结果与通过直接接触法获得的测量结果一致。使用许多教学实验室中可用的设备,该分析提供了一种快速,简单且无损的厚度测量方法。该方法使学生能够进行常规的厚度测量,同时将其介绍给折射率色散,菲涅耳系数,薄膜干涉和回归分析。

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