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Size Dependency of a ZnO Nanorod-Based Piezoelectric Nanogenerator Evaluated by Conductive Atomic Force Microscopy

机译:基于ZnO纳米棒的压电纳米能器的尺寸依赖性通过导电原子力显微镜评估

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ZnO nanorods are one of the most studied materials because it can be facilely grown on a wide range of substrates at low temperature. ZnO exhibits piezoelectricity as well as semiconducting properties, and hence is applicable to piezoelectric nanogenerators and sensors. In the present work, the effect of ZnO nanorods' size on piezoelectric performance was systematically studied using conductive atomic force microscopy (C-AFM). We measured the total C-AFM signal for an observing area and evaluated the piezoelectric performance of the ZnO nanorods based on this total C-AFM signal. First, five samples of ZnO nanorod with distinct aspect ratios were hydrothermally grown on silicon substrates. Afterwards, two types of AFM tips with different spring constants were used to conduct C-AFM as a function of aspect ratio. When the AFM tip with a 42 N/m spring constant was used for the C-AFM measurement, the total C-AFM signal continuously increased with increasing aspect ratio. The total C-AFM signal increased with increasing normal force, but fluctuated with increasing scan rate. The results of the C-AFM experimental measurements were compared with the open-circuit voltage and short-circuit current of ZnO-nanorod based piezoelectric nanogenerator. We show that using C-AFM is a facile and effective method for investigating the optimized aspect ratio of ZnO nanorods for piezoelectric power generation.
机译:ZnO Nanorods是最熟练的材料之一,因为它可以在低温下宽范围的基板上施加。 ZnO表现出压电性以及半导体性能,因此适用于压电纳米液和传感器。在本作的工作中,使用导电原子力显微镜(C-AFM)系统地研究了ZnO纳米棒的大小对压电性能的影响。我们测量了观察区域的总C-AFM信号,并基于该总C-AFM信号评估ZnO纳米棒的压电性能。首先,在硅基板上具有不同纵横比的五个具有不同纵横比的ZnO纳米棒样品。之后,使用具有不同弹簧常数的两种类型的AFM尖端作为纵横比的函数来进行C-AFM。当使用42n / m弹簧常数的AFM尖端用于C-AFM测量时,C-AFM信号的总C-AFM信号随着纵横比的增加而连续增加。总C-AFM信号随着正常力的增加而增加,但随着扫描速率的增加而波动。将C-AFM实验测量结果与基于ZnO-Nanorod的压电纳米电磁器的开口电压和短路电流进行了比较。我们表明,使用C-AFM是一种容易和有效的方法,用于研究压电发电的ZnO纳米棒的优化纵横比。

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