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Determination of the barrier height of Pt-Ir Schottky nano-contacts on Al-doped ZnO thin films by conductive Atomic Force Microscopy

机译：通过导电原子力显微镜测定Al掺杂ZnO薄膜上PT-IR肖特基纳米接触的阻挡高度

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J. Eduardo Rivera L.; Narcizo Muñoz A.; Juliana G. Gutiérrez-Paredes; Pedro A. Tamayo-Meza; Alejandro Alvarez Z.; L. Martínez-Pérez;
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1. Determination of the barrier height ofPt?IrSchottky nano-contacts onAl-doped ZnO thin films by conductive Atomic Force Microscopy [J] . J.Eduardo-River L, N.Mu ?noz-Aguirre, G.Juliana Gutierrez-Paredes, Revista mexicana de fisica . 2018,第6期

机译：通过导电原子力显微镜测定逆晶纳 - 射线纳米接触乙烯型薄膜的屏障高度
2. Interpreting the conductive atomic force microscopy measured inhomogeneous nanoscale surface electrical properties of Al-doped ZnO films [J] . Patel Tvarit, Panda Emila Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films . 2016,第13期

机译：解释导电原子力显微镜测量的Al掺杂ZnO薄膜的不均匀纳米级表面电性能
3. Microstructure influenced variation in the local surface electrical heterogeneity in thickening Al-doped ZnO films: Evidence using both scanning tunnelling spectroscope and conductive atomic force microscope [J] . Patel Tvarit A., Singh Chetan C., Panda Emila Materials science in semiconductor processing . 2018,第期

机译：微观结构影响局部电气异质性在增稠型ZnO膜中的变化：使用扫描隧道分光镜和导电原子力显微镜的证据
4. Electrical Characterization of Polyaniline-ZnO nano-composite Langmuir-Blodgett thin films by Conductive Atomic Force Microscopy [C] . Gurpreet Kaur Bhullar, Ramneek Kaur, K. K. Raina Materials Research Society Meeting . 2014

机译：导电原子力显微镜聚苯胺 - ZnO纳米复合型轧丸 - Blodgett薄膜的电学特性
5. Conductive Atomic Force Microscopy Study of Electron Transport Through Diazonium Derived Films and Mixed – Mode Bonded Layers on Gold and Carbon Surfaces [D] . Reid, Michael Shawn 2012

机译：导电原子力显微镜研究金和碳表面上重氮鎓衍生膜和混合模式键合层中电子传输的过程
6. Influence of Oxygen Pressure on the Domain Dynamics and Local Electrical Properties of BiFe0.95Mn0.05O3 Thin Films Studied by Piezoresponse Force Microscopy and Conductive Atomic Force Microscopy [O] . Kunyu Zhao, Huizhu Yu, Jian Zou, 2017

机译：氧响应对BiFe0.95Mn0.05O3薄膜的畴动态和局部电学特性的压电响应力显微镜和导电原子力显微镜研究
7. Characterization of Al-doped ZnO (AZO) Transparent Conductive Thin films Grown by Atomic Layer Deposition [O] . 2009

机译：用原子层沉积生长的Al掺杂ZnO（AZO）透明导电薄膜的表征

Determination of the barrier height of Pt-Ir Schottky nano-contacts on Al-doped ZnO thin films by conductive Atomic Force Microscopy

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