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Molecular dissection of CHARGE syndrome highlights the vulnerability of neural crest cells to problems with alternative splicing and other transcription-related processes

机译:电荷综合征的分子解剖突出了神经嵴细胞对替代剪接和其他与其他转录相关过程的问题的脆弱性

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摘要

CHARGE syndrome is characterized by co-occurrence of multiple malformations due to abnormal development of neural crest cells. Here, we review the phenotypic and molecular overlap between CHARGE syndrome and similar pathologies, and further discuss the observation that neural crest cells appear especially sensitive to malfunction of the chromatin-transcription-splicing molecular hub.
机译:电荷综合征的特征在于由于神经嵴细胞的异常发育而产生多种畸形的共同。 在这里,我们审查了电荷综合征和类似病理之间的表型和分子重叠,并进一步探讨了神经嵴细胞对染色质转录分子枢纽的故障特别敏感的观察。

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