Structural, optical and electrical characterization of HgxCd1-xTe polycrystalline films fabricated by two-source evaporation technique

摘要

Two-source thermal evaporation technique was used to prepare HgXCd1-xTe thin films onto scratch free transparent glass substrates. The structural investigations revealed that thin films were polycrystalline in nature. Transmittance measurements in the wavelength range (500-2700 nm) were used to calculate optical constants. The analysis of the optical absorption data showed that the optical band gap was of indirect type. In the composition range 0.05 < x < 0.25 the films exhibited an optical band gap between 1.29 and 0.98 eV. In the same composition range the films were p-type and exhibited a resistivity, which varied between 102 and 10(-1) Omega-cm.