首页> 外文期刊>材料 >傾斜対向ターゲット型DCマグネトロンスパッタ法により有機基板に被覆したITO薄膜の光学的および電気的特性に及ぼすスパッタガス庄およびワーク電圧の影響
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傾斜対向ターゲット型DCマグネトロンスパッタ法により有機基板に被覆したITO薄膜の光学的および電気的特性に及ぼすスパッタガス庄およびワーク電圧の影響

机译:倾斜计数器靶型DC磁控溅射方法溅射气体和工件电压对有机基质涂覆的ITO薄膜光学电气特性

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摘要

The ITO film was deposited onto the polyethylene terephthalale (PET) substrate at room temperature by the inclination opposite target type DC magnetron sputtering equipment. An indium tin alloy (In_2O_3 (90wt percent) + SnO_2 (10wt. percent)) target was used. The total sputtering pressure and the work voltage were varied from 0.18 to 0.8 Pa and from -10 to -90V, respectively. The effects of total sputtering pressure and work voltage on the optical and electric properties of ITO film were discussed. The experimental results obtained were summarized as follows ; (1) The ITO film produced at room temperature had microstructure in which a X ray diffraction peak is not clear, regardless of the total sputtering pressure and the work voltage. (2) For PET film deposited ITO film, an optical transmittance was over about 70 percent at the wave length of 600nm. (3) The absorption edge shifted to short the wave length with decreasing the total sputtering pressure and with increasing the work voltage. (4) For the deposited ITO film, the lowest electrical resistivity was about 6.10 X 10~(-4) OMEGA centre dot cm at the sputtering pressure of 0.51Pa when the sputtering pressure increased from 0.18Pa under a constant of -70V.
机译:通过相对的目标类型DC磁控溅射设备的倾斜,在室温下将ITO膜沉积在聚乙烯对骨前(PET)基板上。使用铟锡合金(In_2O_3(90wt%)+ SnO_2(10wt%))靶标。总溅射压力和工作电压分别从0.18至0.8Pa和-10至-90V变化。讨论了总溅射压力的影响及其对ITO膜的光学和电性能的效果。获得的实验结果总结如下; (1)室温产生的ITO膜具有微结构,其中X射线衍射峰值不清晰,无论总溅射压力和工作电压如何。 (2)对于PET薄膜沉积ITO膜,光透射率在600nm的波长下超过约70%。 (3)吸收边缘移位以使波长短,随着总溅射压力和增加工作电压而变短。 (4)对于沉积的ITO薄膜,当溅射压力在-70V常数下溅射压力增加0.51Pa时,最低电阻率为约6.10×10〜(-4)ω中心点Cm。

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