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Spin-polarized scanning tunneling microscopy and spectroscopy study of chromium on a Cr(001) surface

机译:Cr(001)表面铬的自旋极化扫描隧道显微镜和光谱学研究

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摘要

Several tens of chromium layers were deposited at 250 °C on a Cr(001) surface and investigated by spin-polarized scanning tunneling microscopy (SP-STM), Auger electron spectroscopy (AES) and scanning tunneling spectroscopy (STS). Chromium is found to grow with a mound-like morphology resulting from the stacking of several monolayers which do not uniformly cover the whole surface of the substrate. The terminal plane consists of an irregular array of Cr islands with lateral sizes smaller than 20 × 20 nm~2. Combined AES and STS measurements reveal the presence of a significant amount of segregants prior to and after deposition. A detailed investigation of the surface shows that it consists of two types of patches. Thanks to STS measurements, the two types of area have been identified as being either chromium pure or segregant rich. SP-STM experiments have evidenced that the antiferromagnetic layer coupling remains in the chromium mounds after deposition and is not significantly affected by the presence of the segregants.
机译:在250°C下在Cr(001)表面上沉积了几十个铬层,并通过自旋极化扫描隧道显微镜(SP-STM),俄歇电子能谱(AES)和扫描隧道能谱(STS)进行了研究。发现铬以丘状形态生长,这是由于几个单层的堆叠而导致的,这些单层不能均匀覆盖基材的整个表面。终端平面由不规则的Cr岛阵列组成,其横向尺寸小于20×20 nm〜2。 AES和STS的组合测量揭示了在沉积之前和之后存在大量的分离剂。对表面的详细研究表明,它由两种类型的贴剂组成。由于进行了STS测量,因此已将两种类型的区域确定为纯铬或富含隔离剂。 SP-STM实验已证明,反铁磁层耦合在沉积后仍保留在铬堆中,并且不受隔离剂的影响。

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