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首页> 外文期刊>Physica, B. Condensed Matter >Stoichiometric controlling of pulsed laser deposited boron-carbon thin films
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Stoichiometric controlling of pulsed laser deposited boron-carbon thin films

机译:脉冲激光沉积硼碳薄膜的化学计量控制

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The stoichiometry of B-C thin films was controlled via pulsed laser deposition using a series of ceramic B-C targets (B/C ratio was 3.04-5.92). The effects of B/C ratio in target, laser power and substrate-to-target distance on deposition rate, microstructure, stoichiometry and chemical structure were investigated. The maximum deposition rate was obtained at laser power of 90 mJ and substrate-to-target distance of 50 mm. Boron rich B-C films were obtained and the stoichiometry in B-C thin films was controlled in the range 2.9-4.6. Carbon atoms were bonded with only sp ~(3+) hybridization when boron was rich,but with sp ~2 and sp ~(3+) hybridizations when carbon was rich.
机译:通过使用一系列陶瓷B-C靶(B / C比为3.04-5.92)通过脉冲激光沉积控制B-C薄膜的化学计量。研究了靶中的B / C比,激光功率和衬底到靶的距离对沉积速率,微观结构,化学计量和化学结构的影响。在90 mJ的激光功率和50 mm的基板到目标距离下获得最大沉积速率。获得富含硼的B-C膜,并且将B-C薄膜中的化学计量控制在2.9-4.6的范围内。碳原子富集时,碳原子仅通过sp〜(3+)杂化而键合;而碳原子富集时,碳原子仅通过sp〜(3+)杂化。

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