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The effect of doping on low temperature growth of high quality GaAs nanowires on polycrystalline films

机译:掺杂对多晶膜上高质量GaAs纳米线低温生长的影响

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The increasing demand for miniature autonomous sensors requires low cost integration methods, but to date, material limitations have prevented the direct growth of optically active III-V materials on CMOS devices. We report on the deposition of GaAs nanowires on polycrystalline conductive films to allow for direct integration of optoelectronic devices on dissimilar materials. Undoped, Si-doped, and Be-doped nanowires were grown at T-s = 400 degrees C on oxide (indium tin oxide) and metallic (platinum and titanium) films. Be-doping is shown to significantly reduce the nanowire diameter and improve the nanowire aspect ratio to 50:1. Photoluminescence measurements of Be-doped nanowires are 1-2 orders of magnitude stronger than undoped and Si-doped nanowires and have a thermal activation energy of 14 meV, which is comparable to nanowires grown on crystalline substrates. Electrical measurements confirm that the metal-semiconductor junction is Ohmic. These results demonstrate the feasibility of integrating nanowire-based optoelectronic devices directly on CMOS chips.
机译:对微型自主传感器的需求不断增长,需要低成本的集成方法,但迄今为止,材料限制已阻止了光学活性III-V材料在CMOS器件上的直接增长。我们报告了在多晶导电膜上沉积GaAs纳米线的过程,以允许在不同材料上直接集成光电器件。未掺杂,Si掺杂和Be掺杂的纳米线在Ts = 400摄氏度的条件下在氧化物(铟锡氧化物)和金属(铂和钛)薄膜上生长。研究表明,掺杂可以显着减小纳米线的直径,并将纳米线的长宽比提高到50:1。掺杂Be纳米线的光致发光测量值比未掺杂和Si掺杂的纳米线强1-2个数量级,并且其热活化能为14 meV,这与在晶体衬底上生长的纳米线相当。电学测量证实金属-半导体结为欧姆。这些结果证明了将基于纳米线的光电器件直接集成在CMOS芯片上的可行性。

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